forked from luck/tmp_suning_uos_patched
mtd: nand: Fix regression in BBM detection
Commit c7b28e25cb
("mtd: nand: refactor BB
marker detection") caused a regression in detection of factory-set bad
block markers, especially for certain small-page NAND. This fix removes
some unneeded constraints on using NAND_SMALL_BADBLOCK_POS, making the
detection code more correct.
This regression can be seen, for example, in Hynix HY27US081G1M and
similar.
Signed-off-by: Brian Norris <norris@broadcom.com>
Tested-by: Michael Guntsche <mike@it-loops.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This commit is contained in:
parent
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commit
065a1ed8de
@ -2934,14 +2934,10 @@ static struct nand_flash_dev *nand_get_flash_type(struct mtd_info *mtd,
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chip->chip_shift = ffs((unsigned)(chip->chipsize >> 32)) + 32 - 1;
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/* Set the bad block position */
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if (!(busw & NAND_BUSWIDTH_16) && (*maf_id == NAND_MFR_STMICRO ||
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(*maf_id == NAND_MFR_SAMSUNG &&
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mtd->writesize == 512) ||
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*maf_id == NAND_MFR_AMD))
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chip->badblockpos = NAND_SMALL_BADBLOCK_POS;
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else
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if (mtd->writesize > 512 || (busw & NAND_BUSWIDTH_16))
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chip->badblockpos = NAND_LARGE_BADBLOCK_POS;
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else
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chip->badblockpos = NAND_SMALL_BADBLOCK_POS;
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/* Get chip options, preserve non chip based options */
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chip->options &= ~NAND_CHIPOPTIONS_MSK;
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