forked from luck/tmp_suning_uos_patched
x86/memtest: Shorten time for tests
By just reversing the order memtest is using the test patterns, an additional round to zero the memory is not necessary. This might save up to a second or even more for setups which are doing tests on every boot. Signed-off-by: Alexander Holler <holler@ahsoftware.de> Cc: Yinghai Lu <yinghai@kernel.org> Cc: Linus Torvalds <torvalds@linux-foundation.org> Cc: Andrew Morton <akpm@linux-foundation.org> Cc: Peter Zijlstra <a.p.zijlstra@chello.nl> Cc: Thomas Gleixner <tglx@linutronix.de> Link: http://lkml.kernel.org/r/1361029097-8308-1-git-send-email-holler@ahsoftware.de Signed-off-by: Ingo Molnar <mingo@kernel.org>
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@ -9,6 +9,7 @@
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#include <linux/memblock.h>
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static u64 patterns[] __initdata = {
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/* The first entry has to be 0 to leave memtest with zeroed memory */
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0,
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0xffffffffffffffffULL,
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0x5555555555555555ULL,
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@ -110,15 +111,8 @@ void __init early_memtest(unsigned long start, unsigned long end)
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return;
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printk(KERN_INFO "early_memtest: # of tests: %d\n", memtest_pattern);
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for (i = 0; i < memtest_pattern; i++) {
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for (i = memtest_pattern-1; i < UINT_MAX; --i) {
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idx = i % ARRAY_SIZE(patterns);
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do_one_pass(patterns[idx], start, end);
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}
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if (idx > 0) {
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printk(KERN_INFO "early_memtest: wipe out "
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"test pattern from memory\n");
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/* additional test with pattern 0 will do this */
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do_one_pass(0, start, end);
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}
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}
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