forked from luck/tmp_suning_uos_patched
of/unittest: Fix of_platform_depopulate test case
The previous commit, "of/unittest: early return from test skips tests" exposed broken tests for the of_platform_unpopulate() function. The problem was the populate and depopulate calls were not symmetrical like they were intended to be, and unpopulate depends on the parent device to have it's of_node pointer pointing to the parent device node. Fix these bugs so that the test case works correctly. In the process, the test_bus used as a container for the test devices has been changed from a statically allocated struct device (which is bad) to a properly allocated device with a .release() method (which is good). This stops the test code from being a bad example of abusing the device model. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Frank Rowand <frank.rowand@sonymobile.com> Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com> Cc: Pawel Moll <pawel.moll@arm.com>
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@ -751,14 +751,14 @@ static void __init of_selftest_match_node(void)
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}
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}
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struct device test_bus = {
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.init_name = "unittest-bus",
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static const struct platform_device_info test_bus_info = {
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.name = "unittest-bus",
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};
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static void __init of_selftest_platform_populate(void)
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{
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int irq, rc;
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struct device_node *np, *child, *grandchild;
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struct platform_device *pdev;
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struct platform_device *pdev, *test_bus;
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const struct of_device_id match[] = {
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{ .compatible = "test-device", },
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{}
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@ -787,20 +787,22 @@ static void __init of_selftest_platform_populate(void)
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if (!np)
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return;
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rc = device_register(&test_bus);
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test_bus = platform_device_register_full(&test_bus_info);
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rc = PTR_ERR_OR_ZERO(test_bus);
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selftest(!rc, "testbus registration failed; rc=%i\n", rc);
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if (rc)
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return;
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test_bus->dev.of_node = np;
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of_platform_populate(np, match, NULL, &test_bus->dev);
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for_each_child_of_node(np, child) {
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of_platform_populate(child, match, NULL, &test_bus);
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for_each_child_of_node(child, grandchild)
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selftest(of_find_device_by_node(grandchild),
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"Could not create device for node '%s'\n",
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grandchild->name);
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}
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of_platform_depopulate(&test_bus);
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of_platform_depopulate(&test_bus->dev);
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for_each_child_of_node(np, child) {
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for_each_child_of_node(child, grandchild)
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selftest(!of_find_device_by_node(grandchild),
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@ -808,7 +810,7 @@ static void __init of_selftest_platform_populate(void)
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grandchild->name);
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}
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device_unregister(&test_bus);
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platform_device_unregister(test_bus);
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of_node_put(np);
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}
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