forked from luck/tmp_suning_uos_patched
USB: usbtest.c: length, sglen and vary are unsigned, so cannot be negative
length, sglen and vary are unsigned, so cannot be negative see vi drivers/usb/misc/usbtest.c +18 struct usbtest_param { ... unsigned iterations; unsigned length; unsigned vary; unsigned sglen; ... }; Signed-off-by: Roel Kluin <roel.kluin@gmail.com> Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
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@ -1561,8 +1561,7 @@ usbtest_ioctl (struct usb_interface *intf, unsigned int code, void *buf)
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if (code != USBTEST_REQUEST)
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return -EOPNOTSUPP;
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if (param->iterations <= 0 || param->length < 0
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|| param->sglen < 0 || param->vary < 0)
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if (param->iterations <= 0)
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return -EINVAL;
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if (mutex_lock_interruptible(&dev->lock))
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