kernel_optimize_test/tools/testing/nvdimm/acpi_nfit_test.c
Dan Williams f110176633 tools/testing/nvdimm: Populate dirty shutdown data
Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2018-10-17 10:47:19 -07:00

17 lines
435 B
C

// SPDX-License-Identifier: GPL-2.0
// Copyright(c) 2018 Intel Corporation. All rights reserved.
#include <linux/module.h>
#include <linux/printk.h>
#include "watermark.h"
#include <nfit.h>
nfit_test_watermark(acpi_nfit);
/* strong / override definition of nfit_intel_shutdown_status */
void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
{
set_bit(NFIT_MEM_DIRTY_COUNT, &nfit_mem->flags);
nfit_mem->dirty_shutdown = 42;
}