MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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Artem Bityutskiy
parent
72069be936
commit
7163cea15f
330
drivers/mtd/tests/mtd_stresstest.c
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330
drivers/mtd/tests/mtd_stresstest.c
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/*
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* Copyright (C) 2006-2008 Nokia Corporation
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*
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* This program is free software; you can redistribute it and/or modify it
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* under the terms of the GNU General Public License version 2 as published by
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* the Free Software Foundation.
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*
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* This program is distributed in the hope that it will be useful, but WITHOUT
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* ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
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* FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License for
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* more details.
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*
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* You should have received a copy of the GNU General Public License along with
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* this program; see the file COPYING. If not, write to the Free Software
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* Foundation, 59 Temple Place - Suite 330, Boston, MA 02111-1307, USA.
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*
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* Test random reads, writes and erases on MTD device.
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*
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* Author: Adrian Hunter <ext-adrian.hunter@nokia.com>
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*/
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#include <linux/init.h>
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#include <linux/module.h>
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#include <linux/moduleparam.h>
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#include <linux/err.h>
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#include <linux/mtd/mtd.h>
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#include <linux/sched.h>
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#include <linux/vmalloc.h>
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#define PRINT_PREF KERN_INFO "mtd_stresstest: "
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static int dev;
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module_param(dev, int, S_IRUGO);
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MODULE_PARM_DESC(dev, "MTD device number to use");
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static int count = 10000;
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module_param(count, int, S_IRUGO);
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MODULE_PARM_DESC(count, "Number of operations to do (default is 10000)");
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static struct mtd_info *mtd;
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static unsigned char *writebuf;
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static unsigned char *readbuf;
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static unsigned char *bbt;
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static int *offsets;
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static int pgsize;
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static int bufsize;
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static int ebcnt;
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static int pgcnt;
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static unsigned long next = 1;
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static inline unsigned int simple_rand(void)
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{
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next = next * 1103515245 + 12345;
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return (unsigned int)((next / 65536) % 32768);
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}
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static inline void simple_srand(unsigned long seed)
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{
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next = seed;
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}
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static int rand_eb(void)
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{
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int eb;
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again:
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if (ebcnt < 32768)
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eb = simple_rand();
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else
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eb = (simple_rand() << 15) | simple_rand();
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/* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
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eb %= (ebcnt - 1);
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if (bbt[eb])
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goto again;
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return eb;
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}
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static int rand_offs(void)
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{
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int offs;
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if (bufsize < 32768)
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offs = simple_rand();
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else
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offs = (simple_rand() << 15) | simple_rand();
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offs %= bufsize;
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return offs;
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}
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static int rand_len(int offs)
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{
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int len;
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if (bufsize < 32768)
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len = simple_rand();
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else
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len = (simple_rand() << 15) | simple_rand();
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len %= (bufsize - offs);
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return len;
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}
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static int erase_eraseblock(int ebnum)
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{
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int err;
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struct erase_info ei;
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loff_t addr = ebnum * mtd->erasesize;
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memset(&ei, 0, sizeof(struct erase_info));
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ei.mtd = mtd;
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ei.addr = addr;
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ei.len = mtd->erasesize;
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err = mtd->erase(mtd, &ei);
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if (unlikely(err)) {
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printk(PRINT_PREF "error %d while erasing EB %d\n", err, ebnum);
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return err;
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}
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if (unlikely(ei.state == MTD_ERASE_FAILED)) {
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printk(PRINT_PREF "some erase error occurred at EB %d\n",
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ebnum);
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return -EIO;
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}
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return 0;
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}
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static int is_block_bad(int ebnum)
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{
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loff_t addr = ebnum * mtd->erasesize;
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int ret;
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ret = mtd->block_isbad(mtd, addr);
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if (ret)
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printk(PRINT_PREF "block %d is bad\n", ebnum);
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return ret;
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}
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static int do_read(void)
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{
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size_t read = 0;
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int eb = rand_eb();
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int offs = rand_offs();
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int len = rand_len(offs), err;
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loff_t addr;
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if (bbt[eb + 1]) {
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if (offs >= mtd->erasesize)
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offs -= mtd->erasesize;
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if (offs + len > mtd->erasesize)
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len = mtd->erasesize - offs;
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}
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addr = eb * mtd->erasesize + offs;
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err = mtd->read(mtd, addr, len, &read, readbuf);
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if (err == -EUCLEAN)
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err = 0;
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if (unlikely(err || read != len)) {
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printk(PRINT_PREF "error: read failed at 0x%llx\n",
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(long long)addr);
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if (!err)
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err = -EINVAL;
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return err;
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}
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return 0;
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}
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static int do_write(void)
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{
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int eb = rand_eb(), offs, err, len;
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size_t written = 0;
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loff_t addr;
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offs = offsets[eb];
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if (offs >= mtd->erasesize) {
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err = erase_eraseblock(eb);
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if (err)
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return err;
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offs = offsets[eb] = 0;
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}
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len = rand_len(offs);
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len = ((len + pgsize - 1) / pgsize) * pgsize;
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if (offs + len > mtd->erasesize) {
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if (bbt[eb + 1])
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len = mtd->erasesize - offs;
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else {
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err = erase_eraseblock(eb + 1);
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if (err)
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return err;
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offsets[eb + 1] = 0;
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}
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}
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addr = eb * mtd->erasesize + offs;
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err = mtd->write(mtd, addr, len, &written, writebuf);
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if (unlikely(err || written != len)) {
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printk(PRINT_PREF "error: write failed at 0x%llx\n",
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(long long)addr);
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if (!err)
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err = -EINVAL;
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return err;
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}
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offs += len;
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while (offs > mtd->erasesize) {
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offsets[eb++] = mtd->erasesize;
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offs -= mtd->erasesize;
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}
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offsets[eb] = offs;
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return 0;
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}
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static int do_operation(void)
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{
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if (simple_rand() & 1)
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return do_read();
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else
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return do_write();
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}
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static int scan_for_bad_eraseblocks(void)
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{
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int i, bad = 0;
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bbt = kmalloc(ebcnt, GFP_KERNEL);
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if (!bbt) {
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printk(PRINT_PREF "error: cannot allocate memory\n");
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return -ENOMEM;
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}
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memset(bbt, 0 , ebcnt);
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printk(PRINT_PREF "scanning for bad eraseblocks\n");
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for (i = 0; i < ebcnt; ++i) {
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bbt[i] = is_block_bad(i) ? 1 : 0;
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if (bbt[i])
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bad += 1;
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cond_resched();
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}
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printk(PRINT_PREF "scanned %d eraseblocks, %d are bad\n", i, bad);
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return 0;
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}
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static int __init mtd_stresstest_init(void)
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{
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int err;
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int i, op;
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uint64_t tmp;
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printk(KERN_INFO "\n");
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printk(KERN_INFO "=================================================\n");
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printk(PRINT_PREF "MTD device: %d\n", dev);
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mtd = get_mtd_device(NULL, dev);
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if (IS_ERR(mtd)) {
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err = PTR_ERR(mtd);
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printk(PRINT_PREF "error: cannot get MTD device\n");
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return err;
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}
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if (mtd->writesize == 1) {
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printk(PRINT_PREF "not NAND flash, assume page size is 512 "
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"bytes.\n");
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pgsize = 512;
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} else
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pgsize = mtd->writesize;
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tmp = mtd->size;
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do_div(tmp, mtd->erasesize);
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ebcnt = tmp;
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pgcnt = mtd->erasesize / mtd->writesize;
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printk(PRINT_PREF "MTD device size %llu, eraseblock size %u, "
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"page size %u, count of eraseblocks %u, pages per "
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"eraseblock %u, OOB size %u\n",
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(unsigned long long)mtd->size, mtd->erasesize,
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pgsize, ebcnt, pgcnt, mtd->oobsize);
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/* Read or write up 2 eraseblocks at a time */
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bufsize = mtd->erasesize * 2;
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err = -ENOMEM;
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readbuf = vmalloc(bufsize);
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writebuf = vmalloc(bufsize);
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offsets = kmalloc(ebcnt * sizeof(int), GFP_KERNEL);
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if (!readbuf || !writebuf || !offsets) {
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printk(PRINT_PREF "error: cannot allocate memory\n");
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goto out;
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}
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for (i = 0; i < ebcnt; i++)
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offsets[i] = mtd->erasesize;
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simple_srand(current->pid);
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for (i = 0; i < bufsize; i++)
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writebuf[i] = simple_rand();
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err = scan_for_bad_eraseblocks();
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if (err)
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goto out;
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/* Do operations */
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printk(PRINT_PREF "doing operations\n");
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for (op = 0; op < count; op++) {
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if ((op & 1023) == 0)
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printk(PRINT_PREF "%d operations done\n", op);
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err = do_operation();
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if (err)
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goto out;
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cond_resched();
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}
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printk(PRINT_PREF "finished, %d operations done\n", op);
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out:
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kfree(offsets);
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kfree(bbt);
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vfree(writebuf);
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vfree(readbuf);
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put_mtd_device(mtd);
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if (err)
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printk(PRINT_PREF "error %d occurred\n", err);
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printk(KERN_INFO "=================================================\n");
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return err;
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}
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module_init(mtd_stresstest_init);
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static void __exit mtd_stresstest_exit(void)
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{
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return;
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}
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module_exit(mtd_stresstest_exit);
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MODULE_DESCRIPTION("Stress test module");
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MODULE_AUTHOR("Adrian Hunter");
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MODULE_LICENSE("GPL");
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