Grant Likely f2051d6a88 of/selftest: Test structure of device tree ... Add a testcase to verify that the device tree is properly constructed and the lists are in a correct order. The new testcase gets run twice; once after adding the testcase data, and once after removing it again. It is run twice to make sure adding and removing the testcase data doesn't corrupt the data structure. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Gaurav Minocha <gaurav.minocha.os@gmail.com>		2014-10-04 21:20:13 +01:00
..
testcase-data
address.c
base.c	of: make sure of_alias is initialized before accessing it	2014-09-08 15:57:26 +01:00
device.c
dynamic.c	of: Disabling OF functions that use sysfs if CONFIG_SYSFS disabled	2014-09-08 15:57:25 +01:00
fdt_address.c
fdt.c	of/fdt: fix memory range check	2014-09-25 11:55:50 +01:00
irq.c	of/irq: Fix lookup to use 'interrupts-extended' property first	2014-08-16 09:03:58 +01:00
Kconfig
Makefile
of_mdio.c
of_mtd.c
of_net.c
of_pci_irq.c
of_pci.c
of_private.h
of_reserved_mem.c
pdt.c
platform.c
selftest.c	of/selftest: Test structure of device tree	2014-10-04 21:20:13 +01:00